Using the Fundamental Plane of black hole activity to distinguish X-ray processes from weakly accreting black holes

Using the Fundamental Plane of black hole activity to distinguish X-ray processes from weakly accreting black holesDOI: info:10.1111/j.1365-2966.2011.19689.xv. 419No. 1267–286
Plotkin, Richard M., Markoff, Sera, Kelly, Brandon C., Körding, Elmar, and Anderson, Scott F. 2012. "Using the Fundamental Plane of black hole activity to distinguish X-ray processes from weakly accreting black holes." Monthly Notices of the Royal Astronomical Society, 419, (1) 267–286. https://doi.org/10.1111/j.1365-2966.2011.19689.x.
ID: 109894
Type: article
Keywords: SAO