Enhanced solid-state multispin metrology using dynamical decouplingDOI: info:10.1103/PhysRevB.86.045214v. 8645214
Pham, L. M., Bar-Gill, N., Belthangady, C., Le Sage, D., Cappellaro, P., Lukin, M. D., Yacoby, A., and Walsworth, Ronald L. 2012. "Enhanced solid-state multispin metrology using dynamical decoupling." Physical Review B, 86 45214. https://doi.org/10.1103/PhysRevB.86.045214.