A dual beam SEM-based EDS and micro-XRF method for the analysis of large-scale Mesoamerican obsidian tablets

A dual beam SEM-based EDS and micro-XRF method for the analysis of large-scale Mesoamerican obsidian tabletsDOI: info:10.1016/j.jasrep.2020.102781v. 35Elsevier
Sharps, Meredith C., Martinez, Maria M., Brandl, Michael, Lam, Thomas, and Vicenzi, Edward P. 2021. "A dual beam SEM-based EDS and micro-XRF method for the analysis of large-scale Mesoamerican obsidian tablets." Journal of Archaeological Science: Reports, 35. https://doi.org/10.1016/j.jasrep.2020.102781.
ID: 158132
Type: article
Keywords: MCI; NMAI