A Nondestructive Method for Probing Layer Thicknesses in Early Photographs from Micrometers to Nanometers Using SEM-based μXRF SpectrometryDOI: info:10.1093/mam/ozae044.055v. 30
Vicenzi, Edward P., Lam, Thomas, Wetzel, Rachel, and Perich, Shannon T. 2024. "A Nondestructive Method for Probing Layer Thicknesses in Early Photographs from Micrometers to Nanometers Using SEM-based μXRF Spectrometry." Microscopy and Microanalysis, 30, (Supplement 1). https://doi.org/10.1093/mam/ozae044.055.